Publication | Closed Access
Improved analysis and modeling of low-frequency noise in nanoscale MOSFETs
63
Citations
18
References
2012
Year
Device ModelingElectrical EngineeringEngineeringNanoelectronicsElectronic EngineeringBias Temperature InstabilityApplied PhysicsNoiseLow-frequency NoiseMicroelectronicsSemiconductor Device
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