Compact Model Parameter Extraction
Compact Model Parameter Extraction is the systematic process of determining the set of physical and empirical parameters that characterize a semiconductor device’s electrical behavior in a compact model, enabling accurate simulation of device performance within circuit design environments.
415
Publications
16.7K
Citations
1.4K
Authors
477
Institutions
Publications per year
2017–2026
81
Parents
415
1–5 of 415
1.4K
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Centro de Investigación y de Estudios Avanzados del Instituto Politécnico Nacional, Mexico
8 publications · 499 citations
8
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Institut de Microélectronique, Electromagnétisme et Photonique, France
8 publications · 361 citations
8
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1–5 of 1.4K
477
Institut polytechnique de Grenoble
Grenoble, France
13 h-index
48 publications
1.9K citations
University of California, Berkeley
Berkeley, United States
12 h-index
43 publications
1.5K citations
Institut de Microélectronique, Electromagnétisme et Photonique
Grenoble, France
12 h-index
32 publications
1.3K citations
STMicroelectronics (France)
Montrouge, France
11 h-index
30 publications
1K citations
CEA Grenoble
Grenoble, France
10 h-index
25 publications
857 citations
Commissariat à l'Énergie Atomique et aux Énergies Alternatives
Paris, France
10 h-index
25 publications
857 citations

Centre National de la Recherche Scientifique
Paris, France
10 h-index
25 publications
1.1K citations
Texas Instruments (United States)
Dallas, United States
9 h-index
18 publications
1.1K citations
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51 publications · 2.7K citations
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24 publications · 1.8K citations
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24 publications · 1.1K citations
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15 publications · 456 citations
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12 publications · 325 citations
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