Compact Model Parameter Extraction

Compact Model Parameter Extraction is the systematic process of determining the set of physical and empirical parameters that characterize a semiconductor device’s electrical behavior in a compact model, enabling accurate simulation of device performance within circuit design environments.

415

Publications

16.7K

Citations

1.4K

Authors

477

Institutions

Publications per year

2017–2026

81

Authors

1.4K

  1. MS
    M. Schröter

    Technische Universität Dresden, Germany

    9 publications · 265 citations

    9

    h-index

  2. FJ
    Francisco J. García-Sánchez

    Simón Bolívar University, Venezuela

    8 publications · 328 citations

    8

    h-index

  3. AO
    A. Ortíz-Conde

    Simón Bolívar University, Venezuela

    8 publications · 328 citations

    8

    h-index

  4. AC
    A. Cerdeira

    Centro de Investigación y de Estudios Avanzados del Instituto Politécnico Nacional, Mexico

    8 publications · 499 citations

    8

    h-index

  5. GG
    G. Ghibaudo

    Institut de Microélectronique, Electromagnétisme et Photonique, France

    8 publications · 361 citations

    8

    h-index

1–5 of 1.4K

Venues

  1. IEEE Transactions on Electron Devices

    51 publications · 2.7K citations

    27

    h-index

  2. 20

    h-index

  3. Solid-State Electronics

    24 publications · 1.1K citations

    19

    h-index

  4. IEEE Electron Device Letters

    15 publications · 456 citations

    14

    h-index

  5. 12

    h-index

1–5