J.C.H. Phang - Concepedia

Author

J.C.H. Phang

Also Known As

J C H Phang, J. C. H. Phang, J. C. Phang, J. Phang, J.C.H Phang, J.C.H. Phang, J.c.h. Phang, JCH Phang, Jacob C. H. Phang, Jacob C.H. Phang

150

Publications

2.6K

Citations

H-Index

Concepts

All Affiliations

National University of Singapore Italian Institute of Technology

About

J.C.H. Phang is an author at National University of Singapore specializing in engineering, applied physics, and microscopy.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	15	29	2.1K
2	Medicine	5	5	106
3	Health Sciences	3	3	78
4	Natural Sciences	2	2	25
5	Education	1	1	27

J.C.H. Phang

Publications

2.2K

Citations

H-Index

Page 1

	Year	Citations
Analytical methods for the extraction of solar-cell single- and double-diode model parameters from I-V characteristics D.S.H. Chan, J.C.H. Phang IEEE Transactions on Electron Devices Electrical EngineeringEngineeringError ContoursApplied PhysicsBuilding-integrated Photovoltaics	1987	677
Accurate analytical method for the extraction of solar cell model parameters J.C.H. Phang, D.S.H. Chan, Joel Phillips Electronics Letters Solar Physics (Heliophysics)Electrical EngineeringEngineeringEnergy EfficiencyParameter Values	1984	417
A comparative study of extraction methods for solar cell model parameters D.S.H. Chan, Joel Phillips, J.C.H. Phang Solid-State Electronics Electrical EngineeringEngineeringEnergy EfficiencyEnergy ConversionExtraction Methods	1986	376
A direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration D.S.H. Chan, Victor Ong, J.C.H. Phang IEEE Transactions on Electron Devices Electrical EngineeringEngineeringMicrofabricationMicroscopyEbic Line Scan	1995	80
Single‐image signal‐to‐noise ratio estimation John T. L. Thong, K. S. Sim, J.C.H. Phang Scanning EngineeringMicroscopyIntensity SaturationImage DetailsNoise Reduction	2001	69
Determination of secondary electron yield from insulators due to a low-kV electron beam Yuhan Yong, John T. L. Thong, J.C.H. Phang Journal of Applied Physics EngineeringElectron DiffractionPulsed Electron BeamVacuum DeviceSilicon On Insulator	1998	64
Failure analysis of integrated devices by scanning thermal microscopy (SThM) G.B.M. Fiege, Volker K. S. Feige, J.C.H. Phang, Microelectronics Reliability Electrical EngineeringEngineeringHardware ReliabilityMicroscopyMicrofabrication	1998	50
A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan Victor Ong, J.C.H. Phang, D.S.H. Chan Solid-State Electronics EngineeringDiffusion LengthDiffusion ResistanceMicrofabricationMicroscopy	1994	48
Effect of shot noise and secondary emission noise in scanning electron microscope images Kok Swee Sim, John T. L. Thong, J.C.H. Phang Scanning Overall Image SnrHealth SciencesPhysicsMicroscopySecondary Emission Noise	2004	35
A robust focusing and astigmatism correction method for the scanning electron microscope Kenneth Ong, J.C.H. Phang, John T. L. Thong Scanning EngineeringMicroscopyElectron OpticImage AnalysisElectron Microscopy	1997	29

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