IEEE Electron Device Letters · 2023 · 17 citations · 18 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsCarrier TransportHigh-frequency Semiconductor DevicesIii-v SemiconductorsWide Band Gap SemiconductorsWide-bandgap Semiconductor DevicesWide-bandgap SemiconductorsGallium NitrideGallium Nitride (Gan) MaterialsHigh-electron-mobility TransistorsLow-noise AmplificationMetal-metal ContactsNoise FigureNoise Figure AnalysisThreshold Voltage
Low-noise amplification performance of an enhancement-mode p- GaN gate high electron mobility transistor (HEMT) is thoroughly investigated. Featuring a tungsten (W) gate metal and CMOS-compatible metal contacts to source/drain terminals, the device exhibits a positive threshold voltage of 2.7 V. Low gate leakage current density ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\text{I}_{\text {G}}{)}$ </tex-math></inline-formula> of 3.8 pA/mm and 16.3 nA/mm are extracted in pinch-off region and on-state region, respectively. The device delivers an input third-order interception point (IIP3) of 15.8 dBm at 2 GHz, together with good immunity of linearity characteristics against frequency change. A minimum noise figure ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$NF_{\text {min}}{)}$ </tex-math></inline-formula> of 0.9 dB with an associated gain ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\text{G}_{\text {a}}{)}$ </tex-math></inline-formula> of 12.8 dB are achieved at a working frequency of 2 GHz. Furthermore, an examination of the bias and frequency effects on NFmin and <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\text{G}_{\text {a}}$ </tex-math></inline-formula> reveals NFmin of 0.65 dB and <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\text{G}_{\text {a}}$ </tex-math></inline-formula> of 18.3 dB at 1 GHz. This work paves a solid path for the utilization of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${p}$ </tex-math></inline-formula> -GaN HEMT for low noise amplifier applications.
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The effect of gate leakage on the noise figure of AlGaN/GaN HEMTs
C. Sanabria, A. Chakraborty, Hongtao Xu et al. · IEEE Electron Device Letters · 2005 · 114 citations · Full text