R. de Kort - Concepedia

Author

R. de Kort

Philips (Netherlands)

Also Known As

R de Kort, R. de Kort, Randy de Kort

Publications

470

Citations

H-Index

Concepts

All Affiliations

Philips (Netherlands)Philips (Finland)Radboud University Nijmegen University of Twente Philips (Belgium)

About

R. de Kort is an author at Philips (Netherlands) specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	11	11	374
2	Applied Physics	5	5	121
3	Natural Sciences	3	3	153
4	Education	1	1	61
5	Chemistry	1	1	15

R. de Kort

Publications

450

Citations

H-Index

Page 1

	Year	Citations
Real-space imaging of an orbital Kondo resonance on the Cr(001) surface O. Yu. Kolesnychenko, R. de Kort, M. I. Katsnelson, Nature Electron MicroscopyPhysicsMicroscopyOrbital Kondo ResonanceSpectroscopy	2002	76
RF capacitance-voltage characterization of MOSFETs with high leakage dielectrics Jurriaan Schmitz, F.N. Cubaynes, R.J. Havens, IEEE Electron Device Letters Device ModelingElectrical EngineeringMos Parameter ExtractionEngineeringRf Capacitance-voltage Characterization	2003	69
Improved Y-factor method for wide-band on-wafer noise-parameter measurements L.F. Tiemeijer, R.J. Havens, R. de Kort, IEEE Transactions on Microwave Theory and Techniques Electrical EngineeringCold Noise-sourceEngineeringRf SemiconductorMeasurement	2005	61
Record RF performance of standard 90 nm CMOS technology L.F. Tirmejer, R.J. Havens, R. de Kort, Inductor Quality FactorElectrical EngineeringStandard Logic 90EngineeringRadio Frequency	2005	43
Zn- and Cd-induced features at the GaAs(110) and InP(110) surfaces studied by low-temperature scanning tunneling microscopy R. de Kort, M. C. M. M. van der Wielen, André J. A. van Roij, Physical review. B, Condensed matter Ii-vi SemiconductorElectrical EngineeringEngineeringCd-induced FeaturesPhysics	2001	42
Predictive spiral inductor compact model for frequency and time domain L.F. Tiemeijer, R.J. Havens, R. de Kort, Center TapElectrical EngineeringIntegrated Symmetric InductorsEngineeringNonlinear Circuit	2004	37
Surface electronic structure of Cr(001): Experiment and theory O. Yu. Kolesnychenko, G. M. M. Heijnen, A. K. Zhuravlev, Physical Review B Materials ScienceImpurity AtomsEngineeringTunneling MicroscopyPhysics	2005	35
Compact modelling of noise for RF CMOS circuit design A.J. Scholten, L.F. Tiemeijer, R. van Langevelde, IEE Proceedings - Circuits Devices and Systems Device ModelingElectrical EngineeringEngineeringShort-channel Nmos TransistorsCircuit System	2004	32
Modelling the excess noise due to avalanche multiplication in (hetero-junction) bipolar transistors J.C.J. Paasschens, R. de Kort Device ModelingElectrical EngineeringCollector-emitter Breakdown VoltageEngineeringSemiconductor Device	2004	18
Atomically flat ultra-clean Cr(001) surfaces produced by cleavage of a single crystal: scanning tunneling microscopy and spectroscopy study O. Yu. Kolesnychenko, R. de Kort, H. van Kempen Surface Science Materials ScienceSurface CharacterizationEngineeringSurface ChemistryNanotechnology	2001	15

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