R. de Kort

Real-space imaging of an orbital Kondo resonance on the Cr(001) surface

O. Yu. Kolesnychenko, R. de Kort, M. I. Katsnelson et al. · Nature · 2002 · 76 citations · Full text

Electron Microscopy, Physics, Microscopy +4

RF capacitance-voltage characterization of MOSFETs with high leakage dielectrics

Jurriaan Schmitz, F.N. Cubaynes, R.J. Havens et al. · IEEE Electron Device Letters · 2003 · 69 citations

Device Modeling, Electrical Engineering, Mos Parameter Extraction +10

Improved Y-factor method for wide-band on-wafer noise-parameter measurements

L.F. Tiemeijer, R.J. Havens, R. de Kort et al. · IEEE Transactions on Microwave Theory and Techniques · 2005 · 61 citations

Electrical Engineering, Cold Noise-source, Engineering +13

Record RF performance of standard 90 nm CMOS technology

L.F. Tirmejer, R.J. Havens, R. de Kort et al. · 2005 · 43 citations · Full text

Inductor Quality Factor, Electrical Engineering, Standard Logic 90 +12

Zn- and Cd-induced features at the GaAs(110) and InP(110) surfaces studied by low-temperature scanning tunneling microscopy

R. de Kort, M. C. M. M. van der Wielen, André J. A. van Roij et al. · Physical review. B, Condensed matter · 2001 · 42 citations

Ii-vi Semiconductor, Electrical Engineering, Engineering +13