Publication | Open Access
Record RF performance of standard 90 nm CMOS technology
43
Citations
5
References
2005
Year
Unknown Venue
Inductor Quality FactorElectrical EngineeringStandard Logic 90EngineeringRadio FrequencyHigh-frequency DeviceAntennaComputer EngineeringKey Rf DevicesInstrumentationMicroelectronicsMicrowave EngineeringRecord Rf PerformanceRf SubsystemElectromagnetic Compatibility
We have optimized 3 key RF devices realized in standard logic 90 nm CMOS technology and report a record performance in terms of n-MOS maximum oscillation frequency f/sub max/ (280 GHz), varactor tuning range and varactor and inductor quality factor.
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