R.J. Havens

Noise modeling for RF CMOS circuit simulation

A.J. Scholten, L.F. Tiemeijer, R. van Langevelde et al. · IEEE Transactions on Electron Devices · 2003 · 379 citations

Engineering, Electrical Engineering, Circuit Theory +16

A calibrated lumped-element de-embedding technique for on-wafer RF characterization of high-quality inductors and high-speed transistors

L.F. Tiemeijer, R.J. Havens · IEEE Transactions on Electron Devices · 2003 · 130 citations

Engineering, Electrical Engineering, Microelectronics +16

Comparison of the "pad-open-short" and "open-short-load" deembedding techniques for accurate on-wafer RF characterization of high-quality passives

L.F. Tiemeijer, R.J. Havens, A.B.M. Jansman et al. · IEEE Transactions on Microwave Theory and Techniques · 2005 · 123 citations

Engineering, Electrical Engineering, Antennas +16

Accurate thermal noise model for deep-submicron CMOS

A.J. Scholten, H. J. Tromp, L.F. Tiemeijer et al. · 2003 · 101 citations

Engineering, Electrical Engineering, Microelectronics +16

RF capacitance-voltage characterization of MOSFETs with high leakage dielectrics

Jurriaan Schmitz, F.N. Cubaynes, R.J. Havens et al. · IEEE Electron Device Letters · 2003 · 70 citations · Full text

Engineering, Electrical Engineering, Microelectronics +15