R.J. Havens

Noise modeling for RF CMOS circuit simulation

A.J. Scholten, L.F. Tiemeijer, R. van Langevelde et al. · IEEE Transactions on Electron Devices · 2003 · 379 citations

Engineering, Simulation, Channel Segmentation +18

A calibrated lumped-element de-embedding technique for on-wafer RF characterization of high-quality inductors and high-speed transistors

L.F. Tiemeijer, R.J. Havens · IEEE Transactions on Electron Devices · 2003 · 129 citations

Rf Subsystem, Electrical Engineering, Physical Design (Electronics) +14

Comparison of the "pad-open-short" and "open-short-load" deembedding techniques for accurate on-wafer RF characterization of high-quality passives

L.F. Tiemeijer, R.J. Havens, A.B.M. Jansman et al. · IEEE Transactions on Microwave Theory and Techniques · 2005 · 122 citations

Engineering, Radio Frequency, Impedance Errors +16

Accurate thermal noise model for deep-submicron CMOS

A.J. Scholten, H. J. Tromp, L.F. Tiemeijer et al. · 2003 · 100 citations

Engineering, Vlsi Design, Carrier Mobility +16

RF-distortion in deep-submicron CMOS technologies

R. van Langevelde, L.F. Tiemeijer, R.J. Havens et al. · 2002 · 70 citations

Device Modeling, Electrical Engineering, Engineering +15