Improved Y-factor method for wide-band on-wafer noise-parameter measurements

Abstract

A new noise-figure measurement method, which combines the simplicity of the "classical" Y-factor method with the accuracy of the widely used "cold noise-source" method, is reported. Implemented in our fully automated wide-band 1-18-GHz on-wafer noise-parameter measurement system, accurate results are obtained using a small set of precharacterized source impedances. We illustrate our method and its accuracy with data taken on a low-noise GaAs pseudomorphic high electron-mobility transistor device, and quantify the impact of the instrumental uncertainties on the extracted noise parameters.