Journal of Materials Chemistry C · 2020 · 39 citations · 16 references
Natural SciencesChemistryMaterials SciencePolymer ChemistryPolymer EngineeringPolymer MaterialsPolymer AnalysisPolymer CharacterizationPolymer Physical ChemistryPolymer PhysicsPolymer StructurePolymerization ChemistryChain ScissionChain Scission EffectsChain Scission MechanismsMolecular Weight DependenceMolecular Weight Dependence Of Polymer PropertiesPolymer Chain ScissionPolymer Molecular Characteristics
This study on the main chain scission type polymers, PMMA and a copolymer system, shows that the EUV-printability is proportional to the<italic>M</italic><sub>w</sub>of the starting material, which is attributed to the enhanced litho-parameters of higher<italic>M</italic><sub>w</sub>material.
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Radiation damage in soft X-ray microscopy
Jian Wang, Cynthia Morin, L. Li et al. · Journal of Electron Spectroscopy and Related Phenomena · 2008 · 194 citations
Secondary Electrons in EUV Lithography
Justin Torok, Ryan Del Re, Henry Herbol et al. · Journal of Photopolymer Science and Technology · 2013 · 108 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +9