Silicon · 2017 · 35 citations · 20 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesDevice CharacterizationDevice ModelingDevice SimulationDopingField-effect TransistorsShort-channel EffectsChannel DopingChannel Doping EffectsChannel Length ScalingDevice OptimizationDiffusion DopingField-effect Transistor Transfer CharacteristicsFin Field-effect Transistors
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FinFET-a self-aligned double-gate MOSFET scalable to 20 nm
Chenming Hu, Jeffrey Bokor, Tsu‐Jae King et al. · IEEE Transactions on Electron Devices · 2000 · 1.6K citations
Engineering, Electrical Engineering, Electronic Materials +13
Xuejue Huang, Wen‐Chin Lee, C. Kuo et al. · IEEE Transactions on Electron Devices · 2001 · 283 citations
Engineering, Electrical Engineering, Electronic Materials +15