Semiconductor Science and Technology · 2017 · 23 citations · 24 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesSemiconductor MaterialsCmos Circuit DesignDevice CharacterizationDevice ReliabilityIntegrated Circuit DesignIntegrated Circuit DevicesSemiconductor ReliabilityCapacitance-voltage CharacterizationCapacitance-voltage MeasurementsCmos Logic CircuitsCmos ReliabilityDigital Logic CircuitsLogic DevicesLong-term Device ReliabilitySilicon Carbide
Recent advance in high manufacturing readiness level and high temperature CMOS mixed-signal integrated circuits on silicon carbide, Weng, M H, Clark, D T, Wright, S N, Gordon, D L, Duncan, M A, Kirkham, S J, Idris, M I, Chan, H K, Young, R A R, Ramsay, E P, Wright, N G, Horsfall, A B
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