Ron Green

Statistics

Publications

Citations

531

H-Index

Active since

2014

Affiliations

DEVCOM Army Research Laboratory(Current)

Ron Green is an author at DEVCOM Army Research Laboratory specializing in threshold voltage stability, semiconductor reliability, and device characterization.

Publications per year

2014–2016

Publications

Basic Mechanisms of Threshold-Voltage Instability and Implications for Reliability Testing of SiC MOSFETs

Aivars J. Lelis, Ron Green, Daniel B. Habersat et al. · IEEE Transactions on Electron Devices · 2014 · 450 citations

Engineering, Electrical Engineering, Materials Science +17

Threshold-voltage bias-temperature instability in commercially-available SiC MOSFETs

Ron Green, Aivars J. Lelis, Daniel B. Habersat · Japanese Journal of Applied Physics · 2016 · 81 citations

Engineering, Electrical Engineering, Microelectronics +16

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