Concepedia

Capacitance-voltage Measurements

Capacitance-Voltage Measurements is a semiconductor characterization technique that distinguishes itself by quantifying the variation of capacitance with applied voltage to determine doping profiles, interface states, and oxide properties in thin dielectrics.

2.4K

Publications

105.2K

Citations

8.5K

Authors

1.4K

Institutions

Publications per year

2017–2026

278

Variants

C-v Measurements

Parents

Publications

2.4K

Barrier inhomogeneities at Schottky contacts

J.H. Werner, H. Güttler · Journal of Applied Physics · 1991 · 1.6K citations

, , +17

Hafnium and zirconium silicates for advanced gate dielectrics

G. D. Wilk, Robert M. Wallace, J. Anthony · Journal of Applied Physics · 2000 · 972 citations

, , +17

Quantum-mechanical modeling of electron tunneling current from the inversion layer of ultra-thin-oxide nMOSFET's

S.-H. Lo, D. A. Buchanan, W. Wang · IEEE Electron Device Letters · 1997 · 812 citations

, , +16

Depleted hole conductor-free lead halide iodide heterojunction solar cells

Waleed Abu Laban, Lioz Etgar · Energy & Environmental Science · 2013 · 760 citations

, , +17

Surface states at steam-grown silicon-silicon dioxide interfaces

C. N. Berglund · IEEE Transactions on Electron Devices · 1966 · 671 citations

, , +17

1–5 of 2.4K

Authors

8.5K

  1. PC
    Paul C. McIntyre

    Stanford University, United States

    19 publications · 1.6K citations

    17

    h-index

  2. SJ
    S. J. Pearton

    University of Florida, United States

    19 publications · 1.1K citations

    16

    h-index

  3. PK
    Paul K. Hurley

    University College Cork, Ireland

    19 publications · 724 citations

    16

    h-index

  4. UK
    Umesh K. Mishra

    University of California, Santa Barbara, United States

    20 publications · 1.1K citations

    15

    h-index

  5. ŞA
    Ş. Altındal

    Gazi University, Türkiye

    15 publications · 772 citations

    14

    h-index

1–5 of 8.5K

Institutions

1.4K

  1. Centre National de la Recherche Scientifique

    Paris, France

    30 h-index

    254 publications

    10.4K citations

  2. Stanford University

    Stanford, United States

    29 h-index

    150 publications

    11.1K citations

  3. University of California, Santa Barbara

    Santa Barbara, United States

    26 h-index

    212 publications

    11.9K citations

  4. North Carolina State University

    Raleigh, United States

    24 h-index

    130 publications

    7.3K citations

  5. IMEC

    Leuven, Belgium

    22 h-index

    212 publications

    10.7K citations

  6. Sandia National Laboratories

    Albuquerque, United States

    22 h-index

    98 publications

    4.5K citations

  7. KU Leuven

    Leuven, Belgium

    21 h-index

    89 publications

    4.4K citations

  8. IBM Research - Thomas J. Watson Research Center

    Yorktown Heights, United States

    21 h-index

    69 publications

    9.2K citations

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Venues

  1. Applied Physics Letters

    551 publications · 29.7K citations

    85

    h-index

  2. Journal of Applied Physics

    468 publications · 24K citations

    74

    h-index

  3. IEEE Transactions on Electron Devices

    91 publications · 4.8K citations

    33

    h-index

  4. Japanese Journal of Applied Physics

    JJAP · 118 publications · 3.6K citations

    30

    h-index

  5. Journal of The Electrochemical Society

    JES · 62 publications · 2.2K citations

    27

    h-index

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