Concepedia

Long-term Device Reliability

Long-Term Device Reliability is a performance metric that quantifies the sustained operational stability and functional consistency of a device over extended periods under expected usage conditions, distinguishing it from transient or short-term reliability assessments by emphasizing durability, degradation resistance, and failure avoidance throughout the device’s lifecycle.

540

Publications

21.7K

Citations

2.6K

Authors

591

Institutions

Publications per year

2017–2026

123

Parents

Publications

540

Annual Rate of Transvenous Defibrillation Lead Defects in Implantable Cardioverter-Defibrillators Over a Period of >10 Years

Thomas Kleemann, Torsten Becker, Klaus Doenges et al. · Circulation · 2007 · 630 citations

, , +10

Adhesion and debonding of multi-layer thin film structures

Reinhold H. Dauskardt, Michael Lane, Qing Ma et al. · Engineering Fracture Mechanics · 1998 · 629 citations · Full text

, , +17

A new-generation color converter for high-power white LED: transparent Ce<sup>3+</sup>:YAG phosphor-in-glass

Rui Zhang, Hang Lin, Yunlong Yu et al. · Laser & Photonics Review · 2013 · 605 citations

, , +17

Interfacial toughening with self-assembled monolayers enhances perovskite solar cell reliability

Zhenghong Dai, Srinivas K. Yadavalli, Min Chen et al. · Science · 2021 · 598 citations

, , +17

Skin-touch-actuated textile-based triboelectric nanogenerator with black phosphorus for durable biomechanical energy harvesting

Jiaqing Xiong, Peng Cui, Xiaoliang Chen et al. · Nature Communications · 2018 · 561 citations · Full text

, , +16

1–5 of 540

Authors

2.6K

  1. DM
    Daniel M. Fleetwood

    Vanderbilt University, United States

    9 publications · 653 citations

    9

    h-index

  2. MP
    Michael Pecht

    University of Maryland, College Park, United States

    7 publications · 124 citations

    7

    h-index

  3. ES
    E. Suhir

    AT&T (United States), United States

    5 publications · 84 citations

    5

    h-index

  4. SB
    Stephen Bayne

    Texas Tech University, United States

    4 publications · 169 citations

    4

    h-index

  5. RD
    Ronald D. Schrimpf

    Vanderbilt University, United States

    4 publications · 180 citations

    4

    h-index

1–5 of 2.6K

Institutions

591

  1. University of Maryland, College Park

    College Park, United States

    13 h-index

    32 publications

    666 citations

  2. Sandia National Laboratories

    Albuquerque, United States

    11 h-index

    39 publications

    2.5K citations

  3. AT&T (United States)

    Bedminster, United States

    10 h-index

    31 publications

    949 citations

  4. Toshiba (Japan)

    Tokyo, Japan

    9 h-index

    36 publications

    1.4K citations

  5. Intel (United States)

    Santa Clara, United States

    8 h-index

    13 publications

    1K citations

  6. Texas Instruments (United States)

    Dallas, United States

    8 h-index

    33 publications

    2.9K citations

  7. The University of Texas at Austin

    Austin, United States

    7 h-index

    20 publications

    1K citations

  8. National Institute of Advanced Industrial Science and Technology

    Tsukuba, Japan

    7 h-index

    38 publications

    1K citations

1–8 of 591

Venues

  1. IEEE Transactions on Electron Devices

    29 publications · 1.3K citations

    19

    h-index

  2. 14

    h-index

  3. Microelectronics Reliability

    22 publications · 678 citations

    14

    h-index

  4. Japanese Journal of Applied Physics

    JJAP · 13 publications · 322 citations

    11

    h-index

  5. 11

    h-index

1–5