Reliability simulation for analog ICs: Goals, solutions, and challenges

Compact Modeling of MOSFET Wearout Mechanisms for Circuit-Reliability Simulation

Xiaojun Li, Jin Qin, J.B. Bernstein · IEEE Transactions on Device and Materials Reliability · 2008 · 171 citations

Engineering, Electrical Engineering, Electronic Materials +16

Emerging yield and reliability challenges in nanometer CMOS technologies

Georges Gielen, Pieter De Wit, Elie Maricau et al. · 2008 · 119 citations

Engineering, Computer Engineering, Electrical Engineering +17

Statistics of Multiple Trapped Charges in the Gate Oxide of Deeply Scaled MOSFET Devices—Application to NBTI

B. Kaczer, Ph. Roussel, Tibor Grasser et al. · IEEE Electron Device Letters · 2010 · 119 citations

Engineering, Electrical Engineering, Microelectronics +16

Compact MOSFET Modeling for Process Variability-Aware VLSI Circuit Design

Samar K. Saha · IEEE Access · 2014 · 83 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

Probabilistic defect occupancy model for NBTI

J. Martín-Martínez, B. Kaczer, M. Toledano-Luque et al. · 2011 · 78 citations

Engineering, Electrical Engineering, Microelectronics +16