Elie Maricau

Emerging yield and reliability challenges in nanometer CMOS technologies

Georges Gielen, Pieter De Wit, Elie Maricau et al. · 2008 · 119 citations

Engineering, Computer Engineering, Electrical Engineering +17

Computer-Aided Analog Circuit Design for Reliability in Nanometer CMOS

Elie Maricau, Georges Gielen · IEEE Journal on Emerging and Selected Topics in Circuits and Systems · 2011 · 76 citations

Engineering, Computer Engineering, Electrical Engineering +17

Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies

Georges Gielen, Pieter De Wit, Elie Maricau et al. · 2008 Design, Automation and Test in Europe · 2008 · 60 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

Transistor aging-induced degradation of analog circuits: Impact analysis and design guidelines

Elie Maricau, Georges Gielen · 2011 · 57 citations

Engineering, Electrical Engineering, Analog Electronics +16

An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications

Elie Maricau, Pieter De Wit, Georges Gielen · Microelectronics Reliability · 2008 · 44 citations

Engineering, Computer Engineering, Electrical Engineering +17