Pieter De Wit

Emerging yield and reliability challenges in nanometer CMOS technologies

Georges Gielen, Pieter De Wit, Elie Maricau et al. · 2008 · 119 citations

Reliability, Electrical Engineering, Nanometer Cmos Technologies +14

The 25Mg(p, γ)26Al and 25Mg(p, p′) resonances for Ep = 0.31–1.84 MeV

P.M. Endt, Pieter De Wit, C. Alderliesten · Nuclear Physics A · 1986 · 61 citations

Nuclear Physics, Physics, Accelerator Mass Spectrometry +5

Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies

Georges Gielen, Pieter De Wit, Elie Maricau et al. · 2008 Design, Automation and Test in Europe · 2008 · 60 citations · Full text

Reliability, Electrical Engineering, Nanometer Cmos Technologies +14

A 66 $\mu$W 86 ppm$/^{\circ}$C Fully-Integrated 6 MHz Wienbridge Oscillator With a 172 dB Phase Noise FOM

Valentijn De Smedt, Pieter De Wit, Wim Vereecken et al. · IEEE Journal of Solid-State Circuits · 2009 · 58 citations · Full text

Electrical Engineering, New Wienbridge Topology, Engineering +14

The 25Mg(p, γ)26Al reaction; branchings, energies and lifetimes

P.M. Endt, Pieter De Wit, C. Alderliesten · Nuclear Physics A · 1988 · 52 citations

High-energy Nuclear Reaction, Nuclear Physics, Natural Sciences +3