J. Martín-Martínez

Ubiquitous relaxation in BTI stressing—New evaluation and insights

B. Kaczer, Tibor Grasser, Jean-Marc Roussel et al. · 2008 · 247 citations

Ubiquitous Relaxation, Electrical Engineering, Semiconductor Device +15

Emerging yield and reliability challenges in nanometer CMOS technologies

Georges Gielen, Pieter De Wit, Elie Maricau et al. · 2008 · 119 citations

Reliability, Electrical Engineering, Nanometer Cmos Technologies +14

NBTI from the perspective of defect states with widely distributed time scales

B. Kaczer, Tibor Grasser, J. Martín-Martínez et al. · IEEE International Reliability Physics Symposium proceedings · 2009 · 105 citations

Engineering, Defect Tolerance, Defect Times +18

Probabilistic defect occupancy model for NBTI

J. Martín-Martínez, B. Kaczer, M. Toledano-Luque et al. · 2011 · 78 citations

Engineering, Duty Cycle, Defect Tolerance +17

Congenital endplate acetylcholinesterase deficiency responsive to ephedrine

M. Bestué-Cardiel, A. Sáenz de Cabezón-Alvarez, J.L. Capablo-Liesa et al. · Neurology · 2005 · 77 citations

Ache Deficiency, Collagenic Tail, Pathology +16