Microelectronics Reliability · 2005 · 17 citations · 10 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesDefects In Electronic MaterialsDevice CharacterizationDevice ReliabilityFailure AnalysisSemiconductor ReliabilityStress TestingGate Oxide DegradationGate Oxide LeakageGate Oxide ReliabilityOxide Defect StatesOxide ReliabilityReliability Degradation MechanismsStress-induced Failure
10
ESD in silicon integrated circuits
Microelectronics Reliability · 1996 · 442 citations
Substrate pump NMOS for ESD protection applications
C. Duvvury, S. Ramaswamy, A. Amerasekera et al. · 2002 · 80 citations
Engineering, Computer Engineering, Electrical Engineering +9
Low voltage stress-induced-leakage-current in ultrathin gate oxides
Paul E. Nicollian, M. Rödder, D.T. Grider et al. · 2003 · 65 citations