Statistics
Publications
16
Citations
592
H-Index
13
Active since
2002
Vijay Reddy is an author at Texas Instruments (United States) specializing in engineering, microelectronics, and electrical engineering.
Publications per year
2002–2021
16
16
Statistical prediction of circuit aging under process variations
Wenping Wang, Vijay Reddy, Bo Yang et al. · 2008 · 80 citations
Engineering, Computer Engineering, Electrical Engineering +17
Circuit aging prediction for low-power operation
Rui Zheng, Jyothi Velamala, Vijay Reddy et al. · 2009 · 60 citations
Engineering, Computer Engineering, Electrical Engineering +17
Product drift from NBTI: Guardbanding, circuit and statistical effects
Anand Krishnan, Frank Cano, C. Chancellor et al. · 2010 · 43 citations
Engineering, Computer Engineering, Electrical Engineering +17
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