P. Juliano

Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions

Jie Wu, P. Juliano, Elyse Rosenbaum · 2002 · 78 citations

Materials Engineering, Electrical Engineering, Semiconductor Device +14

Electrostatic discharge and high current pulse characterization of epitaxial-base silicon-germanium heterojunction bipolar transistors

Steven H. Voldman, P. Juliano, Rob Johnson et al. · 2002 · 32 citations

Device Modeling, Semiconductor Technology, Electrical Engineering +12

Electrostatic discharge characterization of epitaxial-base silicon-germanium heterojunction bipolar transistors

Steven H. Voldman, P. Juliano, J. Schmidt et al. · 2002 · 31 citations

Electrical Engineering, Bicmos Sige Technology, Engineering +11

A novel SCR macromodel for ESD circuit simulation

P. Juliano, Elyse Rosenbaum · 2002 · 30 citations

Engineering, Simulation, Power Electronics +17

Silicon Germanium heterojunction bipolar transistor ESD power clamps and the Johnson Limit

Steven H. Voldman, A. Botula, David Hui et al. · 2001 · 23 citations

Low-power Electronics, Johnson Limit, Electrical Engineering +12