P. Juliano

Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions

Jie Wu, P. Juliano, Elyse Rosenbaum · 2002 · 78 citations

Engineering, Electrical Engineering, Materials Science +16

Electrostatic discharge and high current pulse characterization of epitaxial-base silicon-germanium heterojunction bipolar transistors

Steven H. Voldman, P. Juliano, Rob Johnson et al. · 2002 · 32 citations

Engineering, Electrical Engineering, Microelectronics +16

Electrostatic discharge characterization of epitaxial-base silicon-germanium heterojunction bipolar transistors

Steven H. Voldman, P. Juliano, J. Schmidt et al. · 2002 · 31 citations

Engineering, Electrical Engineering, Materials Science +17

A novel SCR macromodel for ESD circuit simulation

P. Juliano, Elyse Rosenbaum · 2002 · 30 citations

Engineering, Electrical Engineering, Circuit Theory +12

Silicon Germanium heterojunction bipolar transistor ESD power clamps and the Johnson Limit

Steven H. Voldman, A. Botula, David Hui et al. · 2001 · 23 citations

Engineering, Electrical Engineering, Electronic Materials +15