IEEE Transactions on Nuclear Science · 2004 · 40 citations · 23 references
MedicineElectrical EngineeringRadiation DosimetryAbsorbed DoseHigh-dose Radiation EffectsLow-dose Radiation EffectsRadiation SensitivityDegradationDose-rate EffectsRadiation Damage EffectsRadiation EffectsRadiation Effects On ReliabilityRadiation-hard DevicesRadiation-tolerant ElectronicsRadiation-tolerant Semiconductor Devices
The degradation of discrete and integrated-circuit bipolar technologies irradiated at High Dose Rate (HDR) and then switched to Low Dose Rates (LDR) is studied. It is shown that the degradation rate of switched devices is equal to that found at low dose rates for all the tested devices.
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Response of advanced bipolar processes to ionizing radiation
E.W. Enlow, R.L. Pease, W.E. Combs et al. · IEEE Transactions on Nuclear Science · 1991 · 322 citations
Charge separation for bipolar transistors
S.L. Kosier, Ronald D. Schrimpf, R.N. Nowlin et al. · IEEE Transactions on Nuclear Science · 1993 · 200 citations