Radiation-tolerant Electronics

Radiation-Tolerant Electronics is an academic concept referring to electronic systems designed to operate reliably in ionizing radiation environments by incorporating mitigation techniques that distinguish them from conventional electronics through inherent resilience to radiation-induced faults.

496

Publications

20.2K

Citations

2.4K

Authors

511

Institutions

Publications per year

2017–2026

111

Authors

2.4K

  1. JD
    John D. Cressler

    Georgia Institute of Technology, United States

    16 publications · 489 citations

    15

    h-index

  2. FF
    F. Faccio

    European Organization for Nuclear Research, Switzerland

    17 publications · 855 citations

    13

    h-index

  3. AM
    A. Marchioro

    European Organization for Nuclear Research, Switzerland

    13 publications · 842 citations

    12

    h-index

  4. RA
    Robert A. Reed

    Vanderbilt University, United States

    12 publications · 590 citations

    12

    h-index

  5. DM
    David M. Hiemstra

    University of Saskatchewan, Canada

    12 publications · 285 citations

    11

    h-index

1–5 of 2.4K

Venues

  1. IEEE Transactions on Nuclear Science

    156 publications · 5.8K citations

    40

    h-index

  2. Journal of Instrumentation

    JINST · 16 publications · 987 citations

    13

    h-index

  3. 13

    h-index

  4. Microelectronics Reliability

    13 publications · 515 citations

    11

    h-index

  5. CERN Document Server (European Organization for Nuclear Research)

    Repository · 9 publications · 282 citations

    9

    h-index

1–5