Microelectronics Reliability · 2005 · 53 citations · 12 references
EngineeringComputer EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesCurrent-voltage CharacteristicsDevice CharacterizationDevice ModelingDevice SimulationMetal-oxide-semiconductor Field-effect TransistorsThreshold ModelingBreakdown VoltageNear-threshold VoltageThreshold VoltageThreshold Voltage ControlThreshold Voltage ExtractionThreshold Voltage ModelingThreshold Voltage Scaling
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Robert M. Corless, Gastón H. Gonnet, D. E. G. Hare et al. · Advances in Computational Mathematics · 1996 · 6.2K citations