Marvin H. White

Modeling of transconductance degradation and extraction of threshold voltage in thin oxide MOSFET's

H.‐S. Philip Wong, Marvin H. White, T.J. Krutsick et al. · Solid-State Electronics · 1987 · 315 citations

Device Modeling, Electrical Engineering, Transconductance Degradation +8

Charge retention of scaled SONOS nonvolatile memory devices at elevated temperatures

Yang Yang, Marvin H. White · Solid-State Electronics · 2000 · 204 citations

Non-volatile Memory, Electrical Engineering, Elevated Temperatures +7

Design considerations in scaled SONOS nonvolatile memory devices

Jiankang Bu, Marvin H. White · Solid-State Electronics · 2001 · 156 citations

Non-volatile Memory, Engineering, Microfabrication +6

An analytical retention model for SONOS nonvolatile memory devices in the excess electron state

Yu Wang, Marvin H. White · Solid-State Electronics · 2004 · 140 citations

Non-volatile Memory, Electrical Engineering, Excess Electron State +7

Charge transport and storage of low programming voltage SONOS/MONOS memory devices

Frank Libsch, Marvin H. White · Solid-State Electronics · 1990 · 120 citations

Non-volatile Memory, Electrical Engineering, Engineering +9