An analytical retention model for SONOS nonvolatile memory devices in the excess electron state

On the go with SONOS

Michael White, Dennis A. Adams, Jianhui Bu · IEEE Circuits and Devices Magazine · 2000 · 399 citations

Engineering, Computer Engineering, Electrical Engineering +17

Tunneling to traps in insulators

Ingemar Lundström, Christer Svensson · Journal of Applied Physics · 1972 · 231 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Charge retention of scaled SONOS nonvolatile memory devices at elevated temperatures

Yang Yang, Marvin H. White · Solid-State Electronics · 2000 · 207 citations

Engineering, Computer Engineering, Electrical Engineering +16

Characterization of thin-oxide MNOS memory transistors

M.H. White, J.R. Cricchi · IEEE Transactions on Electron Devices · 1972 · 199 citations

Engineering, Electrical Engineering, Materials Science +17

Trap-assisted charge injection in MNOS structures

Christer Svensson, Ingemar Lundström · Journal of Applied Physics · 1973 · 158 citations

Engineering, Electrical Engineering, Materials Science +17