Charge retention of scaled SONOS nonvolatile memory devices at elevated temperatures

Reduction of hot electron degradation in metal oxide semiconductor transistors by deuterium processing

Joseph W. Lyding, K. Hess, I.C. Kizilyalli · Applied Physics Letters · 1996 · 363 citations

Engineering, Materials Engineering, Materials Science +16

Tunneling to traps in insulators

Ingemar Lundström, Christer Svensson · Journal of Applied Physics · 1972 · 231 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Characterization of thin-oxide MNOS memory transistors

M.H. White, J.R. Cricchi · IEEE Transactions on Electron Devices · 1972 · 199 citations

Engineering, Electrical Engineering, Materials Science +17

Trap-assisted charge injection in MNOS structures

Christer Svensson, Ingemar Lundström · Journal of Applied Physics · 1973 · 158 citations

Engineering, Electrical Engineering, Materials Science +17

Discharge of MNOS structures

Leif Lundkvist, Ingemar Lundström, C. Svensson · Solid-State Electronics · 1973 · 145 citations

Natural Sciences, Physics, Electrochemical Engineering +5