M.H. White

Characterization of surface channel CCD image arrays at low light levels

M.H. White, D. R. Lampe, Friedrich Blaha et al. · IEEE Journal of Solid-State Circuits · 1974 · 316 citations

Engineering, Electrical Engineering, Optoelectronics +16

Characterization of thin-oxide MNOS memory transistors

M.H. White, J.R. Cricchi · IEEE Transactions on Electron Devices · 1972 · 199 citations

Engineering, Electrical Engineering, Materials Science +17

Theory and application of charge pumping for the characterization of Si-SiO/sub 2/ interface and near-interface oxide traps

R.E. Paulsen, M.H. White · IEEE Transactions on Electron Devices · 1994 · 174 citations

Engineering, Electrical Engineering, Materials Science +17

1.1 kV 4H-SiC power UMOSFETs

Anant Agarwal, Jeff B. Casady, L.B. Rowland et al. · IEEE Electron Device Letters · 1997 · 125 citations

Engineering, Electrical Engineering, Materials Science +15

Observation of near-interface oxide traps with the charge-pumping technique

R.E. Paulsen, R.R. Siergiej, M. French et al. · IEEE Electron Device Letters · 1992 · 124 citations

Engineering, Electrical Engineering, Materials Science +17