Modeling of transconductance degradation and extraction of threshold voltage in thin oxide MOSFET's - Concepedia

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Modeling of transconductance degradation and extraction of threshold voltage in thin oxide MOSFET's

315

Citations

38

References

1987

Year

H.‐S. Philip Wong, Marvin H. White, T.J. Krutsick, R.V.H. Booth

Solid-State Electronics

Device ModelingElectrical EngineeringTransconductance DegradationEngineeringNanoelectronicsStress-induced Leakage CurrentBias Temperature InstabilityApplied PhysicsThreshold VoltageMicroelectronicsSemiconductor Device

References

	Year	Citations

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