Impact of pulse quenching effect on soft error vulnerabilities in combinational circuits based on standard cells

Modeling the effect of technology trends on the soft error rate of combinational logic

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Engineering, Computer Engineering, Electrical Engineering +17

Charge Collection and Charge Sharing in a 130 nm CMOS Technology

Oluwole A. Amusan, Arthur F. Witulski, L. W. Massengill et al. · IEEE Transactions on Nuclear Science · 2006 · 398 citations

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An Experimental Study of Soft Errors in Microprocessors

G.P. Saggese, Nachuan Wang, Zbigniew Kalbarczyk et al. · IEEE Micro · 2005 · 160 citations

Engineering, Computer Engineering, Computer Science +17

Single-Event Transient Pulse Quenching in Advanced CMOS Logic Circuits

Jonathan R. Ahlbin, L. W. Massengill, B. L. Bhuva et al. · IEEE Transactions on Nuclear Science · 2009 · 144 citations

Engineering, Electrical Engineering, Microelectronics +11

Analysis of Parasitic PNP Bipolar Transistor Mitigation Using Well Contacts in 130 nm and 90 nm CMOS Technology

Brian D. Olson, Oluwole A. Amusan, Sandeepan DasGupta et al. · IEEE Transactions on Nuclear Science · 2007 · 107 citations

Engineering, Electrical Engineering, Circuit Theory +16