Yankang Du

Impact of Circuit Placement on Single Event Transients in 65 nm Bulk CMOS Technology

Yibai He, Jianjun Chen, Bin Liang et al. · IEEE Transactions on Nuclear Science · 2012 · 37 citations

Engineering, Computer Engineering, Electrical Engineering +17

A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology

Yankang Du, Shuming Chen · IEEE Transactions on Reliability · 2015 · 30 citations

Engineering, Computer Engineering, Electrical Engineering +17

Calculating the Soft Error Vulnerabilities of Combinational Circuits by Re-Considering the Sensitive Area

Shuming Chen, Yankang Du, Biwei Liu et al. · IEEE Transactions on Nuclear Science · 2014 · 25 citations

Engineering, Computer Engineering, Electrical Engineering +13

A Constrained Layout Placement Approach to Enhance Pulse Quenching Effect in Large Combinational Circuits

Yankang Du, Shuming Chen, Biwei Liu · IEEE Transactions on Device and Materials Reliability · 2013 · 25 citations

Engineering, Computer Engineering, Electrical Engineering +13

Impact of pulse quenching effect on soft error vulnerabilities in combinational circuits based on standard cells

Yankang Du · Microelectronics Journal · 2013 · 19 citations

Engineering, Computer Engineering, Electrical Engineering +13