IEEE Electron Device Letters · 1984 · 29 citations · 3 references
EngineeringComputer EngineeringElectrical EngineeringCircuit TheoryMicroelectronicsSemiconductor DevicesCmos Circuit DesignComplementary Metal-oxide-semiconductor TechnologyDevice CharacterizationDevice ReliabilityTemperature MeasurementTiming AnalysisCmos Logic CircuitsHigh-temperature Device OperationLatchup MitigationLeakage Current ModelingTemperature DependenceTemperature Sensitivity
Measurements of the temperature dependence of holding current in bulk CMOS devices indicate that a substantial improvement in latchup resistance may be achieved by liquid-nitrogen temperature operation of CMOS technology.
3
Very small MOSFET's for low-temperature operation
F.H. Gaensslen, V.L. Rideout, E.J. Walker et al. · IEEE Transactions on Electron Devices · 1977 · 303 citations
Operation of Bulk CMOS Devices at Very Low Temperatures
S. Hanamura, Masashi Aoki, T. Masuhara et al. · Symposium on VLSI Technology · 1983 · 26 citations
Engineering, Computer Engineering, Electrical Engineering +14