Concepedia

Latchup Mitigation

Latchup Mitigation is a radiation hardening technique that prevents or suppresses the occurrence of parasitic conduction paths in integrated circuits caused by ionizing radiation, thereby maintaining device functionality and reliability.

220

Publications

6.3K

Citations

755

Authors

193

Institutions

Publications per year

2017–2026

14

Parents

Publications

220

Overview of on-chip electrostatic discharge protection design with SCR-based devices in CMOS integrated circuits

Ming-Dou Ker, Kai‐Cheng Hsu · IEEE Transactions on Device and Materials Reliability · 2005 · 244 citations

, , +13

Application of a pulsed laser for evaluation and optimization of SEU-hard designs [CMOS]

Dale McMorrow, Joseph S. Melinger, S. Büchner et al. · IEEE Transactions on Nuclear Science · 2000 · 154 citations

, , +15

RHBD techniques for mitigating effects of single-event hits using guard-gates

A. Balasubramanian, B. L. Bhuva, Jeff D. Black et al. · IEEE Transactions on Nuclear Science · 2005 · 143 citations

, , +11

Latch-Up in CMOS Integrated Circuits

B. L. Gregory, B.D. Shafer · IEEE Transactions on Nuclear Science · 1973 · 117 citations

, , +10

Simulation of Cosmic-Ray Induced Soft Errors and Latchup in Integrated-Circuit Computer Memories

W. A. Kolasinski, J. B. Blake, J. K. Anthony et al. · IEEE Transactions on Nuclear Science · 1979 · 113 citations

, , +14

1–5 of 220

Authors

755

  1. MK
    Ming‐Dou Ker

    National Yang Ming Chiao Tung University, Taiwan

    19 publications · 416 citations

    13

    h-index

  2. SH
    Steven H. Voldman

    IBM (United States), United States

    10 publications · 227 citations

    10

    h-index

  3. BL
    B. L. Bhuva

    Vanderbilt University, United States

    8 publications · 445 citations

    8

    h-index

  4. RA
    Robert A. Reed

    Vanderbilt University, United States

    7 publications · 250 citations

    7

    h-index

  5. DM
    Dale McMorrow

    United States Naval Research Laboratory, United States

    7 publications · 400 citations

    7

    h-index

1–5 of 755

Institutions

193

  1. National Yang Ming Chiao Tung University

    Hsinchu, Taiwan

    15 h-index

    41 publications

    1.3K citations

  2. Vanderbilt University

    Nashville, United States

    13 h-index

    71 publications

    3.1K citations

  3. IBM (United States)

    Armonk, United States

    13 h-index

    59 publications

    1.4K citations

  4. Texas Instruments (United States)

    Dallas, United States

    9 h-index

    21 publications

    498 citations

  5. Sandia National Laboratories

    Albuquerque, United States

    9 h-index

    26 publications

    992 citations

  6. Goddard Space Flight Center

    Greenbelt, United States

    8 h-index

    21 publications

    578 citations

  7. Infineon Technologies (Germany)

    Munich, Germany

    7 h-index

    22 publications

    457 citations

  8. Centre National d'Études Spatiales

    Paris, France

    7 h-index

    13 publications

    372 citations

1–8 of 193

Venues

  1. IEEE Transactions on Nuclear Science

    47 publications · 1.8K citations

    24

    h-index

  2. IEEE Transactions on Electron Devices

    41 publications · 1K citations

    21

    h-index

  3. Microelectronics Reliability

    10 publications · 257 citations

    10

    h-index

  4. 9

    h-index

  5. IEEE Electron Device Letters

    8 publications · 305 citations

    8

    h-index

1–5