A. Balasubramanian

RHBD techniques for mitigating effects of single-event hits using guard-gates

A. Balasubramanian, B. L. Bhuva, Jeff D. Black et al. · IEEE Transactions on Nuclear Science · 2005 · 142 citations

Hardware Security, Electrical Engineering, Engineering +13

On the radiation-induced soft error performance of hardened sequential elements in advanced bulk CMOS technologies

N. Seifert, V. Ambrose, B. Gill et al. · 2010 · 120 citations

Engineering, Vlsi Design, Computer Architecture +17

Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process

Oluwole A. Amusan, L. W. Massengill, M.P. Baze et al. · IEEE Transactions on Device and Materials Reliability · 2009 · 74 citations

Low-power Electronics, Hardware Security, Electrical Engineering +13

The Effectiveness of TAG or Guard-Gates in SET Suppression Using Delay and Dual-Rail Configurations at 0.35 $\mu$m

Robert L. Shuler, A. Balasubramanian, Balaji Narasimham et al. · IEEE Transactions on Nuclear Science · 2006 · 50 citations

Hardware Security, Electrical Engineering, Engineering +6

Si-based sensor for virus detection

A. Balasubramanian, B. L. Bhuva, Ray Mernaugh et al. · IEEE Sensors Journal · 2005 · 47 citations

Engineering, Dummy Capacitors, Sensors +13