Robert L. Shuler

Quantifying the Effect of Guard Rings and Guard Drains in Mitigating Charge Collection and Charge Spread

Balaji Narasimham, J. Gambles, Robert L. Shuler et al. · IEEE Transactions on Nuclear Science · 2008 · 64 citations

Engineering, Computer Engineering, Electrical Engineering +16

The Effectiveness of TAG or Guard-Gates in SET Suppression Using Delay and Dual-Rail Configurations at 0.35 $\mu$m

Robert L. Shuler, A. Balasubramanian, Balaji Narasimham et al. · IEEE Transactions on Nuclear Science · 2006 · 50 citations

Engineering, Computer Engineering, Electrical Engineering +13

Analysis of soft error rates in combinational and sequential logic and implications of hardening for advanced technologies

N. N. Mahatme, Indranil Chatterjee, B. L. Bhuva et al. · 2010 · 46 citations

Engineering, Computer Engineering, Computer Science +15

Temperature Dependence of Digital Single-Event Transients in Bulk and Fully-Depleted SOI Technologies

Matthew J. Gadlage, Jonathan R. Ahlbin, Vishwanath Ramachandran et al. · IEEE Transactions on Nuclear Science · 2009 · 40 citations · Full text

Engineering, Electrical Engineering, Electronic Materials +16

A RHBD LC-Tank Oscillator Design Tolerant to Single-Event Transients

Tao Wang, Kuande Wang, Li Chen et al. · IEEE Transactions on Nuclear Science · 2010 · 35 citations

Engineering, Electrical Engineering, Low-power Design +13