J. Gambles

Quantifying the Effect of Guard Rings and Guard Drains in Mitigating Charge Collection and Charge Spread

Balaji Narasimham, J. Gambles, Robert L. Shuler et al. · IEEE Transactions on Nuclear Science · 2008 · 64 citations

Engineering, Computer Engineering, Electrical Engineering +16

Total-dose tolerance of the commercial Taiwan Semiconductor Manufacturing Company (TSMC) 0.35-μm CMOS process

R.C. Lacoe, J.V. Osborn, D.C. Mayer et al. · 2002 · 31 citations

Engineering, Electrical Engineering, Microelectronics +16

Comparison of Dual-Rail and TMR Logic Cost Effectiveness and Suitability for FPGAs With Reconfigurable SEU Tolerance

Robert L. Shuler, B. L. Bhuva, Patrick M. O'Neill et al. · IEEE Transactions on Nuclear Science · 2009 · 17 citations

Engineering, Computer Engineering, Electrical Engineering +16

An 860-Mb/s (8158,7136) Low-Density Parity-Check Encoder

Lowell Miles, J. Gambles, G.K. Maki et al. · IEEE Journal of Solid-State Circuits · 2006 · 17 citations

Engineering, Computer Engineering, Computer Science +15

Radiation hardening by design

J. Gambles, G.K. Maki, S. Whitaker · International Journal of Electronics · 2008 · 14 citations

Engineering, Computer Engineering, Electrical Engineering +17