D.C. Mayer

Application of hardness-by-design methodology to radiation-tolerant ASIC technologies

R.C. Lacoe, J.V. Osborn, R. Koga et al. · IEEE Transactions on Nuclear Science · 2000 · 150 citations

Engineering, Computer Engineering, Electrical Engineering +17

Hardness assurance testing of bipolar junction transistors at elevated irradiation temperatures

S.C. Witczak, Ronald D. Schrimpf, Daniel M. Fleetwood et al. · IEEE Transactions on Nuclear Science · 1997 · 134 citations

Engineering, Electrical Engineering, Materials Engineering +17

Space charge limited degradation of bipolar oxides at low electric fields

S.C. Witczak, R.C. Lacoe, D.C. Mayer et al. · IEEE Transactions on Nuclear Science · 1998 · 131 citations · Full text

Engineering, Electrical Engineering, Radiation Physics +16

Observation of single event upsets in analog microcircuits

R. Koga, S.D. Pinkerton, Steven C. Moss et al. · IEEE Transactions on Nuclear Science · 1993 · 130 citations

Engineering, Electrical Engineering, Fault Tolerance +11

Moderated degradation enhancement of lateral pnp transistors due to measurement bias

S.C. Witczak, Ronald D. Schrimpf, Hugh Barnaby et al. · IEEE Transactions on Nuclear Science · 1998 · 84 citations

Engineering, Electrical Engineering, Electronic Materials +16