Jeff D. Black

RHBD techniques for mitigating effects of single-event hits using guard-gates

A. Balasubramanian, B. L. Bhuva, Jeff D. Black et al. · IEEE Transactions on Nuclear Science · 2005 · 142 citations

Hardware Security, Electrical Engineering, Engineering +13

Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process

Oluwole A. Amusan, L. W. Massengill, M.P. Baze et al. · IEEE Transactions on Device and Materials Reliability · 2009 · 74 citations

Low-power Electronics, Hardware Security, Electrical Engineering +13

Device-Orientation Effects on Multiple-Bit Upset in 65 nm SRAMs

Alan D. Tipton, Jonathan A. Pellish, John M. Hutson et al. · IEEE Transactions on Nuclear Science · 2008 · 53 citations

HBD using cascode-Voltage switch logic gates for SET tolerant digital designs

Megan C. Casey, B. L. Bhuva, Jeff D. Black et al. · IEEE Transactions on Nuclear Science · 2005 · 34 citations

Hardware Security, Electrical Engineering, Engineering +13

Single-Event Tolerant Latch Using Cascode-Voltage Switch Logic Gates

Megan C. Casey, B. L. Bhuva, Jeff D. Black et al. · IEEE Transactions on Nuclear Science · 2006 · 18 citations

Hardware Security, Electrical Engineering, New Latch Design +13