V. Ambrose

Soft Error Susceptibilities of 22 nm Tri-Gate Devices

N. Seifert, B. Gill, Shah M. Jahinuzzaman et al. · IEEE Transactions on Nuclear Science · 2012 · 182 citations

Engineering, Vlsi Design, Nm Planar Devices +16

On the radiation-induced soft error performance of hardened sequential elements in advanced bulk CMOS technologies

N. Seifert, V. Ambrose, B. Gill et al. · 2010 · 120 citations

Engineering, Vlsi Design, Computer Architecture +17

Radiation-induced clock jitter and race

N. Seifert, P. Shipley, Mondira Pant et al. · 2005 · 73 citations

Hardware Security, Electrical Engineering, Engineering +15

On the Scalability of Redundancy based SER Mitigation Schemes

N. Seifert, B. Gill, V. Zia et al. · 2007 · 52 citations

Engineering, Vlsi Design, Survivable System +19

Explaining cache SER anomaly using DUE AVF measurement

Arijit Biswas, C. H. Recchia, Shubhendu S. Mukherjee et al. · 2010 · 24 citations

Anomaly Detection, Engineering, Measurement +24