B. Gill

Radiation-Induced Soft Error Rates of Advanced CMOS Bulk Devices

N. Seifert, P. Slankard, Martin Kirsch et al. · 2006 · 202 citations

Hardware Security, Electrical Engineering, Engineering +11

Soft Error Susceptibilities of 22 nm Tri-Gate Devices

N. Seifert, B. Gill, Shah M. Jahinuzzaman et al. · IEEE Transactions on Nuclear Science · 2012 · 182 citations

Engineering, Vlsi Design, Nm Planar Devices +16

Combinational Logic Soft Error Correction

Subhasish Mitra, Ming Zhang, Saad Waqas et al. · 2006 · 164 citations

Logic Synthesis, Fuzzy Logic, Engineering +11

Soft Error Rate Improvements in 14-nm Technology Featuring Second-Generation 3D Tri-Gate Transistors

N. Seifert, Shah M. Jahinuzzaman, Jyothi Velamala et al. · IEEE Transactions on Nuclear Science · 2015 · 123 citations

Engineering, Vlsi Design, Nuclear Physics +16

On the radiation-induced soft error performance of hardened sequential elements in advanced bulk CMOS technologies

N. Seifert, V. Ambrose, B. Gill et al. · 2010 · 120 citations

Engineering, Vlsi Design, Computer Architecture +17