Ming-Dou Ker

Overview of on-chip electrostatic discharge protection design with SCR-based devices in CMOS integrated circuits

Ming-Dou Ker, Kai‐Cheng Hsu · IEEE Transactions on Device and Materials Reliability · 2005 · 241 citations

Low-power Electronics, Hardware Security, Electrical Engineering +13

Complementary-LVTSCR ESD protection circuit for submicron CMOS VLSI/ULSI

Ming-Dou Ker, Chung‐Yu Wu, Hun-Hsien Chang · IEEE Transactions on Electron Devices · 1996 · 66 citations

Hardware Security, Electrical Engineering, Submicron Cmos Vlsi/ulsi +11

ESD test methods on integrated circuits: an overview

Ming-Dou Ker, Jeng-Jie Peng, Hsin-Chin Jiang · 2002 · 46 citations

Engineering, Vlsi Design, Mem Testing +17

Modeling the positive-feedback regenerative process of CMOS latchup by a positive transient pole method. I. theoretical derivation

Ming-Dou Ker, Chung‐Yu Wu · IEEE Transactions on Electron Devices · 1995 · 43 citations

Positive Transient Pole, Electrical Engineering, Engineering +9

Design of Integrated Gate Driver With Threshold Voltage Drop Cancellation in Amorphous Silicon Technology for TFT-LCD Application

Li-Wei Chu, Po‐Tsun Liu, Ming-Dou Ker · Journal of Display Technology · 2011 · 37 citations

Electrical Engineering, Semiconductor Device, Engineering +13