Operation of Bulk CMOS Devices at Very Low Temperatures - Concepedia

Concepedia

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Operation of Bulk CMOS Devices at Very Low Temperatures

26

Citations

0

References

1983

Year

S. Hanamura, Masashi Aoki, T. Masuhara, O. Minato, Yoshio Sakai, Tomohiro Hayashida

Symposium on VLSI Technology

Low-power ElectronicsElectrical EngineeringEngineeringBias Temperature InstabilityApplied PhysicsThermodynamicsBulk CmosHeat TransferMicroelectronics

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