Journal of The Electrochemical Society · 2008 · 28 citations · 9 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesVlsi DesignDevice CharacterizationDevice ModelingDevice SimulationField-effect TransistorsIntegrated Circuit DesignMetal-oxide-semiconductor Field-effect TransistorsCorner EffectsCorner Zone EffectsFabricationField-effect Transistor SimulationFin Field-effect TransistorsSilicon-on-insulator TechnologyThreshold VoltageThreshold Voltage Modeling
Made available in DSpace on 2012-04-17T22:23:48Z (GMT). No. of bitstreams: 1 \nart_GIACOMINI_Trapezoidal_cross-sectional_influence_on_FinFET_threshold_voltage_2008.pdf: 634543 bytes, checksum: 3461b4873907cc2d6224d2ff0fe51603 (MD5) \n Previous issue date: 2008
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