Solid-State Electronics · 2010 · 12 citations · 27 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsComplementary Metal-oxide-semiconductor TechnologyDevice CharacterizationDevice ScalingIntegrated Circuit DesignMetal-oxide-semiconductor Field-effect TransistorsP-n JunctionsDopant DiffusionDopant SegregationDoping Profile AnalysisGate-dependent Current-voltage BehaviorHigh PerformanceMetal-oxide-semiconductor Field-effect Transistor Small-signal ModelsP-n Junction CharacteristicsSemiconductor Doping Profiles
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N-Type Schottky Barrier Source/Drain MOSFET Using Ytterbium Silicide
S. Zhu, Kevin J. Chen, M.-F. Li et al. · IEEE Electron Device Letters · 2004 · 207 citations