Christoph Urban

Impact of electrostatics and doping concentration on the performance of silicon tunnel field-effect transistors

C. Sandow, Joachim Knoch, Christoph Urban et al. · Solid-State Electronics · 2009 · 129 citations

Device Modeling, Electrical Engineering, Engineering +5

Ultrathin Ni Silicides With Low Contact Resistance on Strained and Unstrained Silicon

Lars Knoll, Qing‐Tai Zhao, S. Habicht et al. · IEEE Electron Device Letters · 2010 · 64 citations · Full text

Engineering, Optoelectronic Devices, Silicon On Insulator +17

Schottky-barrier height tuning of NiGe/n-Ge contacts using As and P segregation

Marcel Mueller, Qing‐Tai Zhao, Christoph Urban et al. · Materials Science and Engineering B · 2008 · 41 citations

P Segregation, Wide-bandgap Semiconductor, Electrical Engineering +6

Radio-Frequency Study of Dopant-Segregated n-Type SB-MOSFETs on Thin-Body SOI

Christoph Urban, Mostafa Emam, C. Sandow et al. · IEEE Electron Device Letters · 2010 · 26 citations · Full text

Semiconductors, Dopant-segregated Schottky Barrier, Electrical Engineering +12

Systematic study of Schottky barrier MOSFETs with dopant segregation on thin-body SOI

Christoph Urban, C. Sandow, Qing‐Tai Zhao et al. · Solid-State Electronics · 2010 · 19 citations · Full text

Electrical Engineering, Engineering, Electronic Engineering +6