P.A. Clifton

Dynamic recovery of negative bias temperature instability in <i>p</i>-type metal–oxide–semiconductor field-effect transistors

M. Ershov, Sharad Saxena, H. Karbasi et al. · Applied Physics Letters · 2003 · 161 citations

Engineering, Electrical Engineering, Microelectronics +15

Fermi-level depinning for low-barrier Schottky source/drain transistors

Daniel Connelly, C. Faulkner, P.A. Clifton et al. · Applied Physics Letters · 2006 · 159 citations

Engineering, Electrical Engineering, Materials Science +17

Transient effects and characterization methodology of negative bias temperature instability in pMOS transistors

M. Ershov, R. Lindley, Sharad Saxena et al. · 2003 · 37 citations

Engineering, Electrical Engineering, Electronic Materials +16

Degradation dynamics, recovery, and characterization of negative bias temperature instability

M. Ershov, Sharad Saxena, S. Minehane et al. · Microelectronics Reliability · 2004 · 24 citations

Engineering, Materials Engineering, Materials Science +7

Growth and characterisation of ZnTe and ZnTeCdTe superlattices on GaAs substrates

P.A. Clifton, J.T. Mullins, Paul D. Brown et al. · Journal of Crystal Growth · 1988 · 19 citations

Engineering, Materials Science, Physics +12