S. Minehane

Dynamic recovery of negative bias temperature instability in <i>p</i>-type metal–oxide–semiconductor field-effect transistors

M. Ershov, Sharad Saxena, H. Karbasi et al. · Applied Physics Letters · 2003 · 161 citations

Engineering, Electrical Engineering, Microelectronics +15

Variation in Transistor Performance and Leakage in Nanometer-Scale Technologies

Sharad Saxena, Christopher P. Hess, Hossein Karbasi et al. · IEEE Transactions on Electron Devices · 2008 · 110 citations

Engineering, Computer Engineering, Electrical Engineering +17

Application-specific worst case corners using response surfaces and statistical models

Anirvan M. Sengupta, Sharad Saxena, L. Daldoss et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2005 · 80 citations

Engineering, Computer Engineering, Circuit Theory +16

Transient effects and characterization methodology of negative bias temperature instability in pMOS transistors

M. Ershov, R. Lindley, Sharad Saxena et al. · 2003 · 37 citations

Engineering, Electrical Engineering, Electronic Materials +16

Characterization and modeling of MOSFET mismatch of a deep submicron technology

M. Quarantelli, Sharad Saxena, Nicola Dragone et al. · 2003 · 29 citations

Engineering, Electrical Engineering, Microelectronics +16