Degradation dynamics, recovery, and characterization of negative bias temperature instability

Accelerated Testing: Statistical Models, Test Plans, and Data Analyses.

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Business, Biostatistics, Risk Analysis +13

Negative bias temperature instability: Road to cross in deep submicron silicon semiconductor manufacturing

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Dynamic NBTI of p-MOS transistors and its impact on MOSFET scaling

G. Chen, M.F. Li, C. H. Ang et al. · IEEE Electron Device Letters · 2002 · 163 citations

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Dynamic recovery of negative bias temperature instability in <i>p</i>-type metal–oxide–semiconductor field-effect transistors

M. Ershov, Sharad Saxena, H. Karbasi et al. · Applied Physics Letters · 2003 · 161 citations

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Architecture, Industrial Engineering, Forecasting +11