Publication | Closed Access
Pitfalls of accelerated testing
94
Citations
4
References
1998
Year
EngineeringSoftware EngineeringSoftware AnalysisDeterioration ModelingReliability EngineeringComputational TestingAccelerated TestsSystems EngineeringModeling And SimulationAccelerated TestingStatisticsMany Dangerous PitfallsService Life PredictionPerformance PredictionAccelerated Life TestingReliabilityHardware ReliabilityTesting TechniquePredictive AnalyticsComputer EngineeringComputer ScienceRegression TestingTest-driven DevelopmentProgram AnalysisSoftware Testing
Accelerated tests provide timely data on product life or performance degradation by subjecting units to higher stress levels, but the extrapolation to normal use conditions raises serious concerns and many pitfalls. The paper warns users about pitfalls of accelerated testing. Results are used with a physically based statistical model to predict product life or performance under normal conditions.
Accelerated tests are used to obtain timely information on product life or performance degradation over time. Test units are used more frequently than usual or are subjected to higher than usual levels of accelerating variables like temperature and voltage. Then the results are used, through an appropriate physically-based statistical model, to make predictions about product life or performance over time, at the more moderate use conditions. The extrapolative predictions inherent in the use of accelerated testing raise serious concerns, and the use of accelerated testing has many dangerous pitfalls. This paper warns potential users about some of these pitfalls.
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