S. Winters

Dynamic recovery of negative bias temperature instability in <i>p</i>-type metal–oxide–semiconductor field-effect transistors

M. Ershov, Sharad Saxena, H. Karbasi et al. · Applied Physics Letters · 2003 · 161 citations

Engineering, Electrical Engineering, Microelectronics +15

Transient effects and characterization methodology of negative bias temperature instability in pMOS transistors

M. Ershov, R. Lindley, Sharad Saxena et al. · 2003 · 37 citations

Engineering, Electrical Engineering, Electronic Materials +16

Characterization and modeling of MOSFET mismatch of a deep submicron technology

M. Quarantelli, Sharad Saxena, Nicola Dragone et al. · 2003 · 29 citations

Engineering, Electrical Engineering, Microelectronics +16

Degradation dynamics, recovery, and characterization of negative bias temperature instability

M. Ershov, Sharad Saxena, S. Minehane et al. · Microelectronics Reliability · 2004 · 24 citations

Engineering, Materials Engineering, Materials Science +7

A differential floating gate capacitance mismatch measurement technique

Jorge Hunter, Prasad S. Gudem, S. Winters · 2002 · 12 citations

Engineering, Electrical Engineering, Analog Electronics +16